Abstract:

This short course offers a comprehensive introduction to the principles and techniques of microwave modelling and characterisation, tailored specifically for PhD students seeking foundational knowledge in the field. Focusing on fundamental concepts, the course covers a range of essential methodologies allowing accurate dielectric property determination across various material forms, including liquids, solids, powders, and thin films.

Key topics include:

1. Transmission Line Techniques: Understanding the basics of transmission line theory and its application in microwave characterisation. Case Study: Open-Ended Coaxial Probe.
2. Free-Space Techniques: Introduction to free-space methods for non-contact dielectric property determination. Case Study: broadband measurement technique for characterisation of lossy dielectrics in sub-THz frequency range.
3. Resonance Techniques: Fundamentals of resonant frequency analysis and quality factor determination, with applications to material measurements. Case Studies: cavities (including SCR)., dielectric resonators (SPDR, SiPDR, RuDR, BCDR).
4. Scanning Microwave Microscopy: Overview of scanning microwave microscopy techniques. Case Study: high-resolution dielectric property mapping at the nanoscale.

Throughout the course, emphasis is placed on building a solid understanding of the underlying principles behind each technique, enabling participants to apply them effectively in their research. To this end, the theory and applications will be illustrated with computational modelling results, including simulated EM field distributions. By the end of the course, participants will have gained a comprehensive understanding of microwave-based methods for dielectric property determination, empowering them to conduct accurate and insightful analyses across a wide range of material types and forms.